The OPX-18 allows for visual inspection of microchip components.
With a cube beam splitter for its optical elements, the OPX-18 reduces ghosting seen in conventional half-mirror models for a higher-definition image. This also allows for detection of fine scratches.

Obtain dimension inspection results for elongated connector leads.
The narrow directivity angle OPF series illuminates workpieces from the rear with a narrow directivity light angle and prevents unwanted reflected light and light leakage for clear contour extraction. The 50 × 15 mm rectangular size makes it possible to install lighting on production lines for elongated connector parts and injection needles, and other lines without enough space to install conventional backlighting.

Inspecting appearance of chip capacitor.
Low angle red lighting and blue ring lighting were used in the past though, it took time to switch the lightings and also brightness was not enough for high speed inspection. By utilizing multiple high brightness spot lighting OPS-S series, high speed inspection is possible and also lighting angle can be flexible.

Detecting edge of chip parts at the pick up nozzle.
By utilizing low angle attachment lens on the ring lighting OPR series, the edges of chip parts can be detected clearly without capturing pick up nozzle.